Accurate Recycled FPGA Detection Using an Exhaustive-Fingerprinting Technique Assisted by WID Process Variation Modeling
Ahmed, Foisal, Shintani, Michihiro, Inoue, MichikoYear:
2020
Journal:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
DOI:
10.1109/TCAD.2020.3023684
File:
PDF, 6.82 MB
2020