[IEEE 2020 23rd Euromicro Conference on Digital System Design (DSD) - Kranj, Slovenia (2020.8.26-2020.8.28)] 2020 23rd Euromicro Conference on Digital System Design (DSD) - Evaluation of the Sensitivity of RRAM Cells to Optical Fault Injection Attacks
Petryk, Dmytro, Dyka, Zoya, Perez, Eduardo, Mahadevaiaha, Mamathamba Kalishettyhalli, Kabin, Ievgen, Wenger, Christian, Langendorfer, PeterYear:
2020
DOI:
10.1109/dsd51259.2020.00047
File:
PDF, 879 KB
2020