[IEEE 2020 IEEE International Conference on Design &...

  • Main
  • [IEEE 2020 IEEE International...

[IEEE 2020 IEEE International Conference on Design & Test of Integrated Micro & Nano-Systems (DTS) - Hammamet, Tunisia (2020.6.7-2020.6.10)] 2020 IEEE International Conference on Design & Test of Integrated Micro & Nano-Systems (DTS) - A Kriging Surrogate Modeling to the Sensitivity Analysis of Analog Circuits

Kchaou, Omaya Bellaaj, Kotti, Mouna, Garbaya, Amel, Fakhfakh, Mourad
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2020
DOI:
10.1109/dts48731.2020.9196069
File:
PDF, 295 KB
2020
Conversion to is in progress
Conversion to is failed