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[IEEE 2020 IEEE International Conference on Design & Test of Integrated Micro & Nano-Systems (DTS) - Hammamet, Tunisia (2020.6.7-2020.6.10)] 2020 IEEE International Conference on Design & Test of Integrated Micro & Nano-Systems (DTS) - A Kriging Surrogate Modeling to the Sensitivity Analysis of Analog Circuits
Kchaou, Omaya Bellaaj, Kotti, Mouna, Garbaya, Amel, Fakhfakh, MouradYear:
2020
DOI:
10.1109/dts48731.2020.9196069
File:
PDF, 295 KB
2020