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[IEEE 2020 33rd International Vacuum Nanoelectronics Conference (IVNC) - Lyon, France (2020.7.6-2020.7.10)] 2020 33rd International Vacuum Nanoelectronics Conference (IVNC) - Low-temperature scanning field emission microscope with polarization analysis
Thamm, A.-K., Demydenko, M., Michlmayr, T., Pescia, D., Ramsperger, U.Year:
2020
DOI:
10.1109/ivnc49440.2020.9203490
File:
PDF, 2.90 MB
2020