[IEEE 2020 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD) - Turin, Italy (2020.9.14-2020.9.18)] 2020 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD) - The lateral photovoltage scanning method (LPS): Understanding doping variations in silicon crystals
Kayser, Stefan, Rotundo, Nella, Fuhrmann, Jurgen, Dropka, Natasha, Farrell, PatricioYear:
2020
DOI:
10.1109/nusod49422.2020.9217779
File:
PDF, 1.05 MB
2020