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eWASM: Practical Software Fault Isolation for Reliable Embedded Devices
Peach, Gregor, Pan, Runyu, Wu, Zhuoyi, Parmer, Gabriel, Haster, Christopher, Cherkasova, LudmilaYear:
2020
Journal:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
DOI:
10.1109/tcad.2020.3012647
File:
PDF, 1.50 MB
2020