Efficient Optical Measurement of Welding Studs with Normal...

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IEEE Transactions on Instrumentation and Measurement 2020

Efficient Optical Measurement of Welding Studs with Normal Maps and Convolutional Neural Network

Liu, Huiyu, Yan, Yunhui, Song, Kechen, Chen, Hao, Yu, Han
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Year:
2020
Journal:
IEEE Transactions on Instrumentation and Measurement
DOI:
10.1109/tim.2020.3024389
File:
PDF, 1.45 MB
2020
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