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Constant-Distance Mode Scanning Electrochemical Microscopy (SECM)—Part I: Adaptation of a Non-Optical Shear-Force-Based Positioning Mode for SECM Tips
Bernardo Ballesteros Katemann, Albert Schulte, Wolfgang SchuhmannVolume:
9
Year:
2003
Language:
english
Pages:
9
DOI:
10.1002/chem.200204267
File:
PDF, 231 KB
english, 2003