Effect of heat treatment on electrical and surface properties of tungsten oxide thin films grown by HFCVD technique
Tan, Guang-Lei, Tang, Dan, Dastan, Davoud, Jafari, Azadeh, Silva, José P.B., Yin, Xi-TaoVolume:
122
Journal:
Materials Science in Semiconductor Processing
DOI:
10.1016/j.mssp.2020.105506
Date:
February, 2021
File:
PDF, 4.91 MB
2021