Investigation of particular parameters of a semiconductor...

IOP Conference Series Materials Science and Engineering 2020 / 05 Vol. 862

Investigation of particular parameters of a semiconductor ammonia gas analyzer

Kuchkarov, O A, Abdurakhmonov, I E, Begimkulov, Zh N, Mamirzaev, M A, Khamraeva, D A, Abdurakhmanov, E
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Volume:
862
Journal:
IOP Conference Series: Materials Science and Engineering
DOI:
10.1088/1757-899X/862/6/062101
Date:
May, 2020
File:
PDF, 417 KB
2020
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