Retention Correlated Read Disturb Errors in 3D Charge Trap...

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IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 2020

Retention Correlated Read Disturb Errors in 3D Charge Trap NAND Flash Memory: Observations, Analysis, and Solutions

Kong, Yachen, Zhang, Meng, Zhan, Xuepeng, Cao, Rui, Chen, Jiezhi
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Year:
2020
Journal:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
DOI:
10.1109/TCAD.2020.3025514
File:
PDF, 2.49 MB
2020
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