Microscopic scan-free surface profiling over extended axial...

Microscopic scan-free surface profiling over extended axial ranges by point-spread-function engineering

Gordon-Soffer, Racheli, Weiss, Lucien E., Eshel, Ran, Ferdman, Boris, Nehme, Elias, Bercovici, Moran, Shechtman, Yoav
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Volume:
6
Journal:
Science Advances
DOI:
10.1126/sciadv.abc0332
Date:
October, 2020
File:
PDF, 3.02 MB
2020
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