The Tomographic Atom Probe: A New Dimension In Material...

Microscopy and Microanalysis 1998 / 07 Vol. 4; Iss. S2

The Tomographic Atom Probe: A New Dimension In Material Analysis

Deconihout, B., Pareige, P., Blavette, D., Bostel, A., Menand, A.
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Volume:
4
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927600020511
Date:
July, 1998
File:
PDF, 920 KB
1998
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