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Application of the FIB Lift-Out Technique for the TEM of...

Microscopy and Microanalysis 2001 / 08 Vol. 7; Iss. S2

Application of the FIB Lift-Out Technique for the TEM of Cold Worked Fracture Surfaces

Giannuzzi, Lucille A., White, Henry J., Chen, Wayne C.
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Volume:
7
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927600030786
Date:
August, 2001
File:
PDF, 801 KB
2001
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