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Transmission Electron Microscopy Study of Tin Oxide Thin Films Deposited on the Sapphire Substrate
Dominguez, J. E., Fu, L., Pan, X. Q.Volume:
6
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s143192760003470x
Date:
August, 2000
File:
PDF, 2.13 MB
2000