Improving the Speed and Accuracy of Large-scale Scanning Transmission Electron Microscopy (STEM) Electron Scattering Simulations
Ophus, Colin, Brown, Hamish, Dacosta, Luis Rangel, Pelz, Philipp, Schwartz, Jonathan, Yalisove, Reed, Hovden, Robert, Ciston, Jim, Savitzky, BenjaminJournal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927620014725
Date:
July, 2020
File:
PDF, 686 KB
2020