Atomic Electron Tomography: Past, Present and Future

Microscopy and Microanalysis 2020 / 07

Atomic Electron Tomography: Past, Present and Future

Miao, Jianwei, Tian, Xuezeng, Kim, Dennis, Zhou, Jihan, Yang, Yongsoo, Yang, Yao, Yuan, Yakun, Ophus, Colin, Schmid, Andreas, Yang, Shize, Sun, Fan, Ciccarino, Christopher, Duschatko, Blake, Idrobo, J
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Journal:
Microscopy and Microanalysis
DOI:
10.1017/s143192762001541x
Date:
July, 2020
File:
PDF, 714 KB
2020
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