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Imaging of Electrons with Tracking and Counting Detectors for (S)TEM Applications
Eckert, Björn, Strueder, Lothar, Aschauer, Stefan, Majewski, Petra, Zabel, ThomasJournal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927620017237
Date:
July, 2020
File:
PDF, 481 KB
2020