Quantitative Aberration-Corrected STEM for Studies of Oxide...

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Microscopy and Microanalysis 2020 / 07

Quantitative Aberration-Corrected STEM for Studies of Oxide Superlattices and Topological Defects in Layered Ferroelectrics

Borisevich, Albina, Vasudevan, Rama, Zhou, Yu, Kelley, Kyle, Leonard, Donovan, Kouser, Summayya, Neumayer, Sabine, Maksymovych, Peter, Pantelides, Sokrates, May, Steven, Balke, Nina
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Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927620017298
Date:
July, 2020
File:
PDF, 338 KB
2020
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