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Monitoring the Conductivity of Thin Metal Layers During the Processes of Grain-growth and Dewetting, Using a Desktop FEG-SEM
Bouman, AC, Jansen, Jacob, Griebling, M, Lammers, L, Santos Costa, VM, Vermeulen, JJA, Vervloat, JGA, Hammen, AFJ, Zandbergen, HWJournal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927620018188
Date:
July, 2020
File:
PDF, 361 KB
2020