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Scanning Ion Conductance Microscopy (SICM) for Low-stress Directly Examining of Cellular Mechanics
Gorelkin, Petr, Erofeev, Alexander, Kolmogorov, Vasilii, Efremov, Yuri, Novak, Pavel, Shevchuk, Andrew, Majouga, Alexander, Korchev, YuriJournal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927620019972
Date:
July, 2020
File:
PDF, 624 KB
2020