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Probing Mobile-point-defect-mediated Nanodomain Evolutions in Ferroelastic-ferroelectrics Under High Stress with In-situ TEM
Deng, Yu, Ciston, Jim, Bustillo, Karen, Ophus, Colin, Zhang, Ruopeng, Song, Chengyu, Gammer, Christoph, Minor, AndrewJournal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927620021510
Date:
July, 2020
File:
PDF, 426 KB
2020