Mapping Dopant Defect Complexes at the Nano and Atomic...

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Mapping Dopant Defect Complexes at the Nano and Atomic Scale for Quantum Computing

Hauwiller, Matthew, Kumar, Abinash, LeBeau, James
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Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927620022047
Date:
July, 2020
File:
PDF, 550 KB
2020
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