Challenges in Characterizations of MTJ Thin Film Stack for...

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Microscopy and Microanalysis 2020 / 07

Challenges in Characterizations of MTJ Thin Film Stack for Spin-Transfer Torque MRAM Device by Analytical TEM in Wafer-foundries

Zhao, Wayne, Dixit, Hemant, Mitchell, Travis, Taylor, William
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Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927620022898
Date:
July, 2020
File:
PDF, 517 KB
2020
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