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Focused Ion Beam Sample Preparation for High Temperature In-situ Transmission Electron Microscopy Experiments: Use Carbon for Now.
Gardener, Jules, Akey, Austin, Alsem, Daan Hein, Bell, DavidJournal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927620024150
Date:
July, 2020
File:
PDF, 388 KB
2020