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Development of a beam profile monitor based on silicon strip sensors for low-charge electron beams
Jaster-Merz, S, Assmann, R W, Burkart, F, Dorda, U, Dreyling-Eschweiler, J, Huth, L, Krämer, U, Stanitzki, MVolume:
1596
Journal:
Journal of Physics: Conference Series
DOI:
10.1088/1742-6596/1596/1/012047
Date:
July, 2020
File:
PDF, 2.33 MB
2020