![](/img/cover-not-exists.png)
Deep levels model identification in semiconductor barrier structures
Krylov, Vladimir, Tatmyshevskiy, Konstantin, Bogachev, AlekseyVolume:
896
Journal:
IOP Conference Series: Materials Science and Engineering
DOI:
10.1088/1757-899X/896/1/012125
Date:
August, 2020
File:
PDF, 914 KB
2020