Deep levels model identification in semiconductor barrier...

IOP Conference Series Materials Science and Engineering 2020 / 08 Vol. 896

Deep levels model identification in semiconductor barrier structures

Krylov, Vladimir, Tatmyshevskiy, Konstantin, Bogachev, Aleksey
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Volume:
896
Journal:
IOP Conference Series: Materials Science and Engineering
DOI:
10.1088/1757-899X/896/1/012125
Date:
August, 2020
File:
PDF, 914 KB
2020
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