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Study and production of thin-film memristors based on TiO 2 â TiO x layers
Zhidik, E V, Troyan, P E, Sakharov, Y V, Zhidik, Y S, Korzhenko, D VVolume:
498
Journal:
IOP Conference Series: Materials Science and Engineering
DOI:
10.1088/1757-899x/498/1/012022
Date:
April, 2019
File:
PDF, 433 KB
2019