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[IEEE 2020 57th ACM/IEEE Design Automation Conference (DAC) - San Francisco, CA, USA (2020.7.20-2020.7.24)] 2020 57th ACM/IEEE Design Automation Conference (DAC) - FTDL: A Tailored FPGA-Overlay for Deep Learning with High Scalability
Shi, Runbin, Ding, Yuhao, Wei, Xuechao, Li, He, Liu, Hang, So, Hayden K.-H., Ding, CaiwenYear:
2020
DOI:
10.1109/dac18072.2020.9218581
File:
PDF, 1.15 MB
2020