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[IEEE 2020 IEEE XXVII International Conference on Electronics, Electrical Engineering and Computing (INTERCON) - Lima, Peru (2020.9.3-2020.9.5)] 2020 IEEE XXVII International Conference on Electronics, Electrical Engineering and Computing (INTERCON) - Scalpel Region Detection based on the Location of Color Marks and Edge Detection
Suarez-Quispe, Juan Carlos, Ramos, Oscar E.Year:
2020
DOI:
10.1109/intercon50315.2020.9220207
File:
PDF, 3.83 MB
2020