A Robust Non-destructive Test Scheme based on Multi-Stage...

  • Main
  • 2020
  • A Robust Non-destructive Test Scheme based on Multi-Stage...
IEEE Transactions on Power Electronics 2020

A Robust Non-destructive Test Scheme based on Multi-Stage Anode Voltage Detection for 4500 V Single Cell Turn-off Capability of Press Packed Devices

Liu, Jiapeng, Yu, Zhanqing, Wang, Xiaorui, Ren, Chunpin, Chen, Zhengyu, Zhao, Biao, Chen, Fanglin, Zeng, Rong
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2020
Journal:
IEEE Transactions on Power Electronics
DOI:
10.1109/tpel.2020.3032693
File:
PDF, 6.38 MB
2020
Conversion to is in progress
Conversion to is failed