High-Resolution Soybean Yield Mapping Across the US Midwest...

Remote Sensing 2020 / 10 Vol. 12; Iss. 21

High-Resolution Soybean Yield Mapping Across the US Midwest Using Subfield Harvester Data

Dado, Walter T., Deines, Jillian M., Patel, Rinkal, Liang, Sang-Zi, Lobell, David B.
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Volume:
12
Journal:
Remote Sensing
DOI:
10.3390/rs12213471
Date:
October, 2020
File:
PDF, 3.22 MB
2020
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