![](/img/cover-not-exists.png)
Investigation of monolayers by secondary ion mass spectroscopy (SIMS)
K.D. Klöppel, W. SeidelVolume:
31
Year:
1979
Language:
english
Pages:
10
DOI:
10.1016/0020-7381(79)80114-x
File:
PDF, 610 KB
english, 1979