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Fault detection based on one-class deep learning for manufacturing applications limited to an imbalanced database
Lee, Jeongsu, Lee, Young Chul, Kim, Jeong TaeVolume:
57
Journal:
Journal of Manufacturing Systems
DOI:
10.1016/j.jmsy.2020.10.013
Date:
October, 2020
File:
PDF, 4.46 MB
2020