Effect of short-circuit degradation on the remaining useful...

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Microelectronics Reliability 2020 / 11

Effect of short-circuit degradation on the remaining useful lifetime of SiC MOSFETs and its failure analysis

Du, H., Letz, S., Baker, N., Goetz, T., Iannuzzo, F., Schletz, A.
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Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2020.113784
Date:
November, 2020
File:
PDF, 1.81 MB
2020
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