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Improved depth characterization of internal defect using the fusion of shearography and speckle interferometry
Gu, Guoqing, Pan, Yun, Qiu, Chengchun, Zhu, ChengjieVolume:
135
Journal:
Optics & Laser Technology
DOI:
10.1016/j.optlastec.2020.106701
Date:
March, 2021
File:
PDF, 3.80 MB
2021