Improved depth characterization of internal defect using...

Improved depth characterization of internal defect using the fusion of shearography and speckle interferometry

Gu, Guoqing, Pan, Yun, Qiu, Chengchun, Zhu, Chengjie
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
135
Journal:
Optics & Laser Technology
DOI:
10.1016/j.optlastec.2020.106701
Date:
March, 2021
File:
PDF, 3.80 MB
2021
Conversion to is in progress
Conversion to is failed