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Crystallographic Features and Subband Transitions of Al/InAs Metal-Semiconductor Junctions
Zhang, J.P., Tsujino, S., Thomas, M., Allen, S.J.Volume:
6
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927600037958
Date:
August, 2000
File:
PDF, 1.74 MB
2000