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A Novel Method for Automated Acquisition of Tilt Series for Electron Tomography Based on Pre-Calibration of the Specimen Stage
Ziese, U., Janssen, A.H., Krift, T.P. van der, Balen, A.G. van, Ruijter, W.J. de, Roster, A.J.Volume:
6
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S143192760003823X
Date:
August, 2000
File:
PDF, 2.09 MB
2000