Atomic Structure of Si-SiO 2...

Microscopy and Microanalysis 1997 / 08 Vol. 3; Iss. S2

Atomic Structure of Si-SiO 2 Interface

Duscher, G., Banhart, F., Müllejans, H., Pennycook, S.J., Rühle, M.
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Volume:
3
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927600009181
Date:
August, 1997
File:
PDF, 734 KB
1997
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