![](/img/cover-not-exists.png)
Micrometric laser characterization of a 300μm fully-depleted monolithic active pixel sensor in standard 110 nm CMOS technology
Giampaolo, R.A.Volume:
15
Journal:
Journal of Instrumentation
DOI:
10.1088/1748-0221/15/06/c06052
Date:
June, 2020
File:
PDF, 1.76 MB
2020