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[IEEE 2020 25th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) - Vienna, Austria (2020.9.8-2020.9.11)] 2020 25th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) - A Deep Learning Approach for Work Related Stress Detection from Audio Streams in Cyber Physical Environments
Madhavi, Ishara, Chamishka, Sadil, Nawaratne, Rashmika, Nanayakkara, Vishaka, Alahakoon, Damminda, De Silva, DaswinYear:
2020
DOI:
10.1109/ETFA46521.2020.9212098
File:
PDF, 921 KB
2020