[IEEE 2020 57th ACM/IEEE Design Automation Conference (DAC) - San Francisco, CA, USA (2020.7.20-2020.7.24)] 2020 57th ACM/IEEE Design Automation Conference (DAC) - Runtime Trust Evaluation and Hardware Trojan Detection Using On-Chip EM Sensors
He, Jiaji, Guo, Xiaolong, Ma, Haocheng, Liu, Yanjiang, Zhao, Yiqiang, Jin, YierYear:
2020
DOI:
10.1109/dac18072.2020.9218514
File:
PDF, 8.29 MB
2020