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[IEEE 2020 57th ACM/IEEE Design Automation Conference (DAC) - San Francisco, CA, USA (2020.7.20-2020.7.24)] 2020 57th ACM/IEEE Design Automation Conference (DAC) - Characterization and Applications of Spatial Variation Models for Silicon Microring-Based Optical Transceivers
Wang, Yuyang, Hulme, Jared, Sun, Peng, Jain, Mudit, Seyedi, M. Ashkan, Fiorentino, Marco, Beausoleil, Raymond G., Cheng, Kwang-TingYear:
2020
DOI:
10.1109/dac18072.2020.9218608
File:
PDF, 4.02 MB
2020