[IEEE 2020 57th ACM/IEEE Design Automation Conference (DAC) - San Francisco, CA, USA (2020.7.20-2020.7.24)] 2020 57th ACM/IEEE Design Automation Conference (DAC) - Verification for Field-coupled Nanocomputing Circuits
Walter, Marcel, Wille, Robert, Torres, Frank Sill, Grose, Daniel, Drechsler, RolfYear:
2020
DOI:
10.1109/dac18072.2020.9218641
File:
PDF, 1.18 MB
2020