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[IEEE 2020 IEEE International Conference on Design & Test of Integrated Micro & Nano-Systems (DTS) - Hammamet, Tunisia (2020.6.7-2020.6.10)] 2020 IEEE International Conference on Design & Test of Integrated Micro & Nano-Systems (DTS) - Epileptic seizure detection using Multivariate Empirical Mode Decomposition and Support Vector Machines
Mahjoub, Chahira, Chaibi, Sahbi, Krikid, Fatma, Nica, Anca, Bouquin Jeannes, Regine Le, Kachouri, AbdennaceurYear:
2020
DOI:
10.1109/dts48731.2020.9196156
File:
PDF, 313 KB
2020