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[IEEE 2020 25th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) - Vienna, Austria (2020.9.8-2020.9.11)] 2020 25th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) - Towards a 3D Scanning/VR-based Product Inspection Station
Azangoo, Mohammad, Blech, Jan Olaf, Dwi Atmojo, Udayanto, Vyatkin, Valeriy, Dhakal, Kamal, Eriksson, Mikael, Lehtimaki, Miika, Leinola, Jonathan, Pietarila, PyryYear:
2020
DOI:
10.1109/etfa46521.2020.9212184
File:
PDF, 1.08 MB
2020