[IEEE 2019 3rd International Conference on Radiation Effects of Electronic Devices (ICREED) - Chongqing, China (2019.5.29-2019.5.31)] 2019 3rd International Conference on Radiation Effects of Electronic Devices (ICREED) - Study on Radiation Degeneration Mechanism and Test for CTR of Optocoupler
Xiaoliang, Li, Pengchao, Xue, Yanqiu, Liu, Bo, Mei, hongwei, Zhang, Lei, LuoYear:
2019
DOI:
10.1109/icreed49760.2019.9205169
File:
PDF, 1.67 MB
2019