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[IEEE 2020 IEEE International Test Conference in Asia (ITC-Asia) - Taipei, Taiwan (2020.9.23-2020.9.25)] 2020 IEEE International Test Conference in Asia (ITC-Asia) - Diagnosis technique for Clustered Multiple Transition Delay Faults
You, Yan-Shen, Liu, Chih-Yan, Wu, Mu-Ting, Chen, Po-Wei, Li, James Chien-MoYear:
2020
DOI:
10.1109/itc-asia51099.2020.00021
File:
PDF, 616 KB
2020