Applied AI in instrumentation and measurement: The deep...

IEEE Instrumentation & Measurement Magazine 2020 / 9 Vol. 23; Iss. 6

Applied AI in instrumentation and measurement: The deep learning revolution

Khanafer, Mounib, Shirmohammadi, Shervin
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Volume:
23
Journal:
IEEE Instrumentation & Measurement Magazine
DOI:
10.1109/mim.2020.9200875
Date:
September, 2020
File:
PDF, 394 KB
2020
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