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Chemical disorder of a-SiC layer induced in 6H-SiC by Cs and I ions co-implantation: Raman spectroscopy analysis
Madito, M.J., Hlatshwayo, T.T., Mtshali, C.B.Volume:
538
Journal:
Applied Surface Science
DOI:
10.1016/j.apsusc.2020.148099
Date:
February, 2021
File:
PDF, 7.88 MB
2021